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Interpretive Summaries:
2002 - Evaluating Site-specific Soybean Management within the Mississippi Soybean Verification Program (SMART – Soybean Management through Application of Research and Technology
2001 - Evaluating Site-Specific Soybean Management within the Mississippi Soybean Verification Program (SMART – Soybean Management through Application of Research and Technology)
2000 - Variability of Soil Chemical and Physical Properties and Their Influence on Soybean Yield in Mississippi
Variability of Soil Chemical and Physical Properties and Their Influence on Soybean Yield in Mississippi, 2000
Three fields were selected near Hernando, Leland and Shaw in western Mississippi for ECa mapping (using a Veris 3100 meter), soil fertility sampling on a 2.5-acre grid, determination of elevation, and topography. These fields were involved in an on-going SMART program, intended to demonstrate implementation of research based technology to improve production efficiency and farm profitability. Soil textures ranged from silt loam to clay. Measured physical and chemical soil properties were related to yield data generated from GPS-referenced yield monitors on farmer combines. Yields averaged 37, 55, and 57 bu/A in the fields near Hernando (nonirrigated), Leland (irrigated), and Shaw (irrigated), respectively. The standard deviations in yields were 6.5, 13.3, and 13.8 bu/A, respectively. Variability in soil properties among the fields ranged from low to very high. Soil pH exhibited the least spatial variability while P and Ca tended to have the most. Relationships between soil fertility and ECa varied among the fields. Regression analyses indicated yield variability tended to be explained best by topography, soil clay content, and general soil fertility, although the influences were not straightforward. Factors associated with good soil drainage (surface and internal) and plant-available soil water showed the strongest relationships with yield. Use of soil mapping units was not helpful in defining soil management zones or in explaining yield variability. MS-08F
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